Surface chemical composition obtained from XPS survey spectra and WCA of dECMf surface before and after plasma treatment

SampleC (%)O (%)N (%)N/CO/CWCA (°)
dECMfs74.3 ± 0.715.5 ± 0.87.8 ± 0.60.11 ± 0.010.21 ± 0.0192.4 ± 1.5
dECMf*64.5 ± 1.920.3 ± 1.113.07 ± 1.10.20 ± 0.020.31 ± 0.0386.1 ± 0.5

A statistically significant variation in the relative surface concentration of C (P = 0.0108), O (P = 0.0111) and N (P = 0.0225) was observed. The WCA showed a significant decrease after plasma treatment (P < 0.0001). Statistical analysis: unpaired t test with Welch correction